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PlantU DMS
PlantU DMS

PlantU DMS combines interactive defect analysis with automated defect data processing. It processes inspection-equipment data and provides an accessible analysis interface to accelerate root-cause investigation and defect improvement.

Product Functions
Automated defect data processing: transfer files, convert formats and import data from AOI and other semiconductor inspection equipment, with support for multiple equipment formats.
Interactive defect analysis: explore advanced tools including Stack Map, Defect to CP and Defect Zone Analysis.
Deployment Benefits
  • 1
    Defect map analysis: examine defect distributions and images, and analyze reticle and regional repeatability.
  • 2
    Defect map analysis: examine defect distributions and images, and analyze reticle and regional repeatability.
  • 3
    Defect image classification: classify defect images to support root-cause analysis and help engineers identify process issues more efficiently.
  • 4
    Overlay defects with electrical test data and use Kill Ratio analysis to classify their impact on yield.
  • 5
    Overlay defects with electrical test data and use Kill Ratio analysis to classify their impact on yield.
  • 6
    AI analysis: Identify spatial patterns in defects and quickly detect non-random anomalies.
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